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Limitations in predicting defect level based on stuck-at fault coverage.
Jaehong Park
Mark Naivar
Rohit Kapur
M. Ray Mercer
Thomas W. Williams
Published in:
VTS (1994)
Keyphrases
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information systems
levels of abstraction
data sets
databases
data mining
genetic algorithm
learning algorithm
decision making
knowledge base
similarity measure
pattern recognition
multiresolution