EffiTest: efficient delay test and statistical prediction for configuring post-silicon tunable buffers.
Grace Li ZhangBing LiUlf SchlichtmannPublished in: DAC (2016)
Keyphrases
- statistical tests
- low cost
- data driven
- statistical significance
- computationally expensive
- statistical analysis
- prediction accuracy
- statistical inference
- cost effective
- production system
- prediction model
- post hoc
- genetic algorithm
- prediction algorithm
- predictive model
- information theoretic
- test cases
- database applications
- x ray
- high speed