Test generation for mixed-signal devices using signal flow graphs.

Rajesh Ramadoss Michael L. Bushnell

Published in: VLSI Design (1996)

Keyphrases

test generation
flow graphs
mixed signal
test cases
low power
flow graph
multi channel
signal processing
static analysis
decision table
quality assurance
rough sets
power consumption
image processing
software testing
embedded systems
real time
high speed
low cost
decision trees
databases