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Impact of Modern Process Technologies on the Electrical Parameters of Interconnects.

Debjit SinhaJianfeng LuoSubramanian RajagopalanShabbir H. BatterywalaNarendra V. ShenoyHai Zhou
Published in: VLSI Design (2007)
Keyphrases
  • real time
  • information systems
  • information technology
  • probabilistic model
  • maximum likelihood