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Impact of Modern Process Technologies on the Electrical Parameters of Interconnects.
Debjit Sinha
Jianfeng Luo
Subramanian Rajagopalan
Shabbir H. Batterywala
Narendra V. Shenoy
Hai Zhou
Published in:
VLSI Design (2007)
Keyphrases
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real time
information systems
information technology
probabilistic model
maximum likelihood