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A 12-electrode piezoelectric tube scanner for fast atomic force microscopy.

Yuen Kuan YongBilal AhmedS. O. Reza Moheimani
Published in: ACC (2010)
Keyphrases
  • atomic force microscopy
  • high voltage
  • structured light
  • cross sections
  • data structure
  • pairwise
  • hand held
  • electric field
  • genetic algorithm
  • knowledge base
  • wide range
  • probabilistic model
  • management system
  • laser scanner