Test Generation and Site of Fault for Combinational Circuits Using Logic Petri Nets.
Jui-I TsaiChing-Cheng TengChing-Hung LeePublished in: SMC (2006)
Keyphrases
- petri net
- test generation
- logic circuits
- asynchronous circuits
- fault models
- test cases
- petri net model
- discrete event systems
- programmable logic controller
- manufacturing systems
- model based diagnosis
- quality assurance
- static analysis
- colored petri nets
- fuzzy petri net
- ims ld
- logic programming
- software testing
- concurrent systems
- stochastic petri net
- service composition
- power dissipation
- life cycle
- control system