Strength violation effect on soft-error detection in sub-micron technology.

M. Reza Javaheri Reza Sedaghat

Published in: Microelectron. Reliab. (2010)

Keyphrases

error detection
error correction
error recovery
error correcting
data cleansing
data processing
fault tolerance
cost effective
error resilient
cmos technology
metadata
case study
rapid development
sensor networks
mobile agents
electron beam