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Fault modeling for FinFET circuits.

Muzaffer O. SimsirAjay N. BhojNiraj K. Jha
Published in: NANOARCH (2010)
Keyphrases
  • fault detection
  • real time
  • genetic algorithm
  • data sets
  • neural network
  • machine learning
  • learning algorithm
  • website
  • three dimensional
  • database systems
  • multiresolution
  • high speed
  • fault diagnosis
  • modeling method