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CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity.

Junrui ZhangFrancesco BellandoManeesha RupakulaErick Garcia CorderoN. EbejerJ. LongoFabien WildhaberHoel GuerinAdrian Mihai Ionescu
Published in: DRC (2018)
Keyphrases
  • cmos technology
  • low cost
  • high speed
  • information retrieval
  • field effect transistors
  • neural network
  • high density
  • grain size
  • databases
  • computer vision
  • power supply
  • metal oxide