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Quick and cost-efficient A/D converter static characterization using low-precision testing signal.
Wei Wei Qin
Sai-Weng Sin
Seng-Pan U
Rui Paulo Martins
Published in:
Microelectron. J. (2018)
Keyphrases
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cost efficient
signal processing
dynamic analysis
non stationary
transfer function
test data
signal detection
image processing
test cases
high frequency
control method
real time
multiresolution
wavelet analysis
high voltage
governmental organizations