The Sensitivity of Subsurface Contact Resonance Atomic Force Microscopy to Changes in the Depth of Buried Features: a Nonlinear Approach.
Marinus Marcelus HoogestegerHamed SadeghianHenk NijmeijerPublished in: AIM (2021)
Keyphrases
- feature extraction
- atomic force microscopy
- multiscale
- classification accuracy
- feature set
- sensitivity analysis
- high level
- object recognition
- feature values
- keypoints
- spatial information
- image classification
- specific features
- invariant features
- structural information
- key features
- false positives
- real time
- low level
- prior knowledge
- feature space
- decision trees