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Neutron-induced soft error rate estimation for SRAM using PHITS.

Shusuke YoshimotoTakuro AmashitaMasayoshi YoshimuraYusuke MatsunagaHiroto YasuuraShintaro IzumiHiroshi KawaguchiMasahiko Yoshimoto
Published in: IOLTS (2012)
Keyphrases
  • error rate
  • test set
  • estimation error
  • lower error rates
  • power consumption
  • data transmission
  • false discovery rate
  • data sets
  • feature extraction
  • rule sets
  • generalization error