Login / Signup
State-reuse Test Generation for Progressive Random Access Scan: Solution to Test Power, Application Time and Data Size.
Dong Hyun Baik
Kewal K. Saluja
Published in:
Asian Test Symposium (2005)
Keyphrases
</>
test generation
database
random access
data sets
training data
databases
image data
image quality
test set
data quality
data structure
computational complexity
xml documents
multi dimensional
data transfer
memory size