Sign in

Function-based ATPG for Path Delay Faults using the Launch-Off-Capture Scan Architecture.

Edward FlaniganRajsekhar AdapaHailong CuiMichael LaisneSpyros TragoudasTsvetomir Petrov
Published in: VLSI Design (2007)
Keyphrases
  • management system
  • software architecture
  • real time
  • fault diagnosis
  • fault detection
  • optimal path
  • shortest path
  • data flow
  • scan data