An Address Maskable Parallel Testing for Ultra High Density DRAMs.

Yoshikazu Morooka Shigeru Mori Hiroshi Miyamoto Michihiro Yamada

Published in: ITC (1991)

Keyphrases

high density
low density
close proximity
thin film
high power
data center
high bandwidth
magnetic tape
parallel processing
magnetic recording
high speed
real time
data management
cloud computing
parallel implementation
massively parallel