Login / Signup

films grown on Si substrate for low-k applications.

A. A. Dakhel
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • metal oxide
  • x ray
  • bayesian networks
  • rf sputtering
  • databases
  • real world
  • multiscale
  • multi agent
  • search algorithm
  • artificial neural networks
  • low cost
  • high speed
  • film thickness
  • si sio