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Sensitivity of C-band backscatter to surface roughness parameters measured at different scales.

Alex Martinez-AgirreJesús Álvarez-MozosHans LievensNiko E. C. VerhoestRafael Giménez
Published in: IGARSS (2015)
Keyphrases
  • surface roughness
  • manufacturing process
  • specular reflection
  • fuzzy inference system
  • neural network
  • single image
  • pose estimation
  • background subtraction
  • machine vision
  • curved surfaces