Monitoring Chip Branch Failure in Multichip IGBT Modules Based on Gate Charge.
Kaihong WangPengju SunBinxin ZhuQuanming LuoXiong DuPublished in: IEEE Trans. Ind. Electron. (2023)
Keyphrases
- cmos technology
- failure detection
- monitoring system
- low cost
- high speed
- charge coupled devices
- simulation software
- modular design
- real time
- low power
- programmable logic
- modular structure
- functional modules
- analog vlsi
- failure modes
- root cause
- nm technology
- ultra low power
- focal plane
- condition monitoring
- circuit design
- high density