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in commercial GaN-on-Si HEMTs.

Serge KarboyanMichael J. Uren ManikantJames W. PomeroyMartin Kuball
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • database
  • structuring elements
  • neural network
  • computer vision
  • three dimensional
  • learning algorithm
  • artificial intelligence
  • knowledge base
  • high level
  • image analysis
  • commercial products
  • metal oxide