X-ray Image Classification Using Random Forests with Local Wavelet-Based CS-Local Binary Patterns.
ByoungChul KoSeong-Hoon KimJae-Yeal NamPublished in: J. Digit. Imaging (2011)
Keyphrases
- x ray
- random forests
- local binary pattern
- image classification
- feature extraction
- texture classification
- random forest
- face recognition
- texture analysis
- multiscale
- multiresolution
- x ray images
- texture features
- machine learning algorithms
- multi label
- image features
- ensemble methods
- image representation
- digital x ray images
- logistic regression
- decision trees
- spatial information
- rotation invariant
- face detection
- three dimensional
- sparse representation
- background subtraction
- feature set
- pattern recognition
- feature vectors
- texture images
- depth images
- feature selection
- facial expressions
- pairwise