Crack Defect Detection Processing Algorithm and Method of MEMS Devices Based on Image Processing Technology.
Yu ZhengSusu LiYuan XiangZhenxing ZhuPublished in: IEEE Access (2023)
Keyphrases
- improved algorithm
- high accuracy
- detection algorithm
- dynamic programming
- computational cost
- computational complexity
- optimization algorithm
- cost function
- synthetic and real images
- objective function
- preprocessing
- experimental evaluation
- computational efficiency
- clustering method
- image processing
- classification method
- single pass
- recognition algorithm
- theoretical analysis
- detection method
- optimization method
- experimental study
- computationally efficient
- k means
- similarity measure
- convergence rate
- segmentation method
- energy function
- matching algorithm
- high efficiency
- significant improvement
- tree structure
- estimation algorithm
- input data
- probabilistic model
- image processing algorithms
- digitized images
- mathematical model
- defect detection
- learning algorithm
- image segmentation
- graph cuts
- support vector machine svm
- machine vision
- selection algorithm
- segmentation algorithm
- region of interest
- simulated annealing
- image sequences
- optimal solution
- edge detection
- multiscale
- classification algorithm