Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation.
André ClausnerSimon SchlipfGottfried KurzMichael OttoJens PaulKay-Uwe GieringJens WarmuthAndré LangeRoland JanckeAndreas AalRüdiger RosenkranzMartin GallEhrenfried ZschechPublished in: IRPS (2018)