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A 16 kb 1T1C FeRAM test chip using current-based reference scheme.
Joseph Wai Kit Siu
Yadollah Eslami
Ali Sheikholeslami
P. Glenn Gulak
Toru Endo
Shoichiro Kawashima
Published in:
CICC (2002)
Keyphrases
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high speed
knowledge base
data structure
statistical tests
image processing
low cost
bit rate
reference frame