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A Passed Test Case Cluster Method to Improve Fault Localization.

Weibo WangYonghao WuYong Liu
Published in: J. Circuits Syst. Comput. (2021)
Keyphrases
  • test cases
  • test data
  • database
  • fault localization
  • databases
  • neural network
  • clustering algorithm
  • expert systems
  • data model
  • error rate
  • object oriented databases
  • software testing
  • simulated annealing algorithm