Characterization of Transistor Mismatch for Statistical CAD of Submicron CMOS Analog Circuits.
Christopher J. AbelChristopher MichaelMohammed IsmailC. S. TengR. LahrioPublished in: ISCAS (1993)
Keyphrases
- analog circuits
- low power
- power dissipation
- vlsi circuits
- high speed
- power consumption
- digital circuits
- low cost
- fault diagnosis
- circuit design
- cmos technology
- mixed signal
- integrated circuit
- computer aided
- computer aided design
- power supply
- object oriented
- infrared
- machine learning
- statistical analysis
- real time
- multi channel
- multi agent systems
- electron beam
- genetic algorithm