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Reliability analysis of pHEMT power amplifier with an on-chip linearizer.
J.-S. Yuan
Y. Wang
J. Steighner
H.-D. Yen
S.-L. Jang
G.-W. Huang
W.-K. Yeh
Published in:
Microelectron. Reliab. (2013)
Keyphrases
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reliability analysis
high power
high density
ibm power processor
high speed
low power
low cost
power consumption
chip design
data mining
power dissipation
condition monitoring
statistical modeling
cmos technology
dynamic range
model selection
artificial neural networks