In-situ power monitoring scheme and its application in dynamic voltage and threshold scaling for digital CMOS integrated circuits.
Nandish Ashutosh MehtaGururaj V. NaikBharadwaj S. AmruturPublished in: ISLPED (2010)
Keyphrases
- integrated circuit
- metal oxide semiconductor
- power consumption
- power supply
- high speed
- power losses
- electron beam
- low voltage
- monitoring system
- power system
- dynamic environments
- single phase
- power quality
- low cost
- electricity markets
- printed circuit boards
- wireless sensor networks
- power dissipation
- power management
- cmos technology
- mixed signal
- analog vlsi
- electrical power