A nano-CMOS process variation induced read failure tolerant SRAM cell.

Jawar Singh Jimson Mathew Saraju P. Mohanty Dhiraj K. Pradhan

Published in: ISCAS (2008)

Keyphrases

power consumption
nano scale
data transmission
real time
databases
high speed
low power
failure rate
signal transduction pathways
database
root cause
microscopic images
failure detection
failure prediction
white blood cells