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Mechanism of anomalous recovery in advanced SiGe bipolar transistors after low dose rate irradiation for very high total doses.

V. S. PershenkovMiguel UllánM. WilderH. SpielerE. SpencerS. ResciaF. M. NewcomerF. Martinez-McKinneyW. KononenkoA. A. GrilloS. Díez
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • low dose
  • high density
  • x ray
  • dual energy
  • ct scans
  • low power
  • integrated circuit
  • contrast enhancement
  • image processing
  • edge detection
  • computed tomography
  • imaging modalities
  • lung nodules
  • signal dependent noise