Artificial Scanning Electron Microscopy Images Created by Generative Adversarial Networks from Simulated Particle Assemblies.
Jonas BalsMatthias EpplePublished in: Adv. Intell. Syst. (2023)
Keyphrases
- electron microscopy
- image data
- image database
- low energy
- x ray
- ground truth
- image collections
- image analysis
- input image
- image retrieval
- edge detection
- three dimensional
- image registration
- image classification
- fully automatic
- object recognition
- image stacks
- image features
- image regions
- transmission electron microscopy
- segmentation method
- artificial neural networks
- microscopy images
- neural network