Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors.
Masato NakasatoMichiko InoueSatoshi OhtakeHideo FujiwaraPublished in: IEICE Trans. Inf. Syst. (2008)
Keyphrases
- error rate
- cost function
- experimental evaluation
- synthetic data
- software architecture
- user interface
- significant improvement
- high precision
- test data
- classification method
- high accuracy
- feature set
- simulated annealing
- information loss
- segmentation method
- software systems
- detection method
- support vector machine svm
- case study
- probabilistic model
- computational cost
- dynamic programming
- preprocessing
- computational complexity