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A model-based regression test selection approach for embedded applications.
Swarnendu Biswas
Rajib Mall
Manoranjan Satpathy
Srihari Sukumaran
Published in:
ACM SIGSOFT Softw. Eng. Notes (2009)
Keyphrases
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database
real world
embedded systems
information retrieval
regression model
selection algorithm
statistical tests
watermarking algorithm
machine learning
data driven
model selection
cross validation
data mining
statistical significance
selection criteria
simple linear
random selection
polynomial regression