Calibration of scanning electron microscope using a multi-image non-linear minimization process.
Le CuiÉric MarchandPublished in: ICRA (2014)
Keyphrases
- scanning electron microscope
- image data
- single image
- image features
- input image
- image classification
- matching process
- template matching
- multiscale
- image analysis
- image representation
- image segmentation
- image pixels
- test images
- similarity measure
- image retrieval
- low level
- edge detection
- image content
- hough transform
- image regions
- segmentation method
- energy function
- depth map
- gray level
- high resolution
- region of interest
- segmentation algorithm
- objective function
- multi view
- regularization term
- lens distortion
- image processing