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An Approach to Minimize Testability Overhead for BILBO based Built-In-Self-Test.

Anupam BasuThomas Charles WilsonDilip K. BanerjiJayanti C. Majithia
Published in: VLSI Design (1992)
Keyphrases
  • built in self test
  • test data generation
  • database systems
  • database
  • real time
  • neural network
  • data mining
  • computer vision
  • case study
  • multi agent
  • low overhead