A Stochastic Method for Defect Level Analysis of Pseudorandom Testing.
Wen-Ben JoneSunil R. DasPublished in: VLSI Design (1998)
Keyphrases
- preprocessing
- high precision
- cost function
- data sets
- segmentation algorithm
- statistical analysis
- segmentation method
- neural network
- detection method
- feature set
- high accuracy
- computational cost
- significant improvement
- computational complexity
- objective function
- classification method
- test data
- encryption algorithm
- input data
- probabilistic model
- experimental evaluation
- k means
- similarity measure