On-chip ESD protection designs with SCR-based devices in RF integrated circuits.
Chun-Yu LinRong-Kun ChangPublished in: ICCE-TW (2014)
Keyphrases
- integrated circuit
- printed circuit boards
- built in self test
- low cost
- nm technology
- high speed
- mobile devices
- metal oxide semiconductor
- radio frequency
- low power
- high density
- electron beam
- reconfigurable hardware
- information security
- relevance feedback
- analog vlsi
- low power consumption
- smart phones
- design space
- physical design
- programmable logic
- image retrieval
- application specific integrated circuits
- data protection
- processing capabilities
- image sensor
- design tools
- hardware implementation