Reliability aspects of binary vector-matrix-multiplications using ReRAM devices.
Christopher BengelJohannes MohrStefan WiefelsAbhairaj SinghAnteneh GebregiorgisRajendra BishnoiSaid HamdiouiRainer WaserDirk J. WoutersStephan MenzelPublished in: Neuromorph. Comput. Eng. (2022)
Keyphrases
- sparse matrix
- singular value decomposition
- binary vectors
- dot product
- transformation matrix
- matrix representation
- eigenvalues and eigenvectors
- feature vectors
- sparse matrices
- positive definite
- linearly independent
- data sets
- fuzzy membership
- binary features
- embedded devices
- covariance matrix
- rows and columns
- singular values
- intelligent environments
- mobile devices
- symmetric matrix
- neural network