BINARY FEATURES
Experts
- Lambert Schomaker
- Somaya Al-Máadeed
- Vincent Christlein
- Joseph Kee-Yin Ng
- Imran Siddiqi
- Umapada Pal
- Horst Bunke
- Marius Bulacu
- Lianwen Jin
- Alicia Fornés
- Sheng He
- Andreas K. Maier
- Diego Bertolini
- Sargur N. Srihari
- Chawki Djeddi
- Marcus Liwicki
- Ahmed Bouridane
- Luiz S. Oliveira
- Josep Lladós
- Claudio De Stefano
- Suresh Sundaram
- Volker Märgner
- Shinsuke Hara
- Yaâcoub Hannad
- Mohamed El Youssfi El Kettani
- Gerald Friedland
- Abdelaali Hassaïne
- Xiaoqing Ding
- Junyang Zhou
- Francesco Fontanella
- Jaeyoung Choi
- Anguelos Nicolaou
- Ameur Bensefia
- Jen-Chun Chang
- Michael Blumenstein
- Alessandra Scotto di Freca
- Chien-Sheng Chen
- Kai-Ten Feng
- Slim Kanoun
Venues
- CoRR
- ICDAR
- ICFHR
- ICPR
- ICASSP
- IEEE Access
- Sensors
- Pattern Recognit.
- Wirel. Pers. Commun.
- PIMRC
- Multim. Tools Appl.
- GLOBECOM
- IEEE Trans. Signal Process.
- ICC
- Document Analysis Systems
- WCNC
- Pattern Recognit. Lett.
- Expert Syst. Appl.
- IEEE Trans. Veh. Technol.
- CVPR
- ICRA
- IEEE Commun. Lett.
- IEICE Trans. Commun.
- ICIP
- Entropy
- IEEE Trans. Mob. Comput.
- SIU
- IPIN
- AAAI
- SMC
- Int. J. Document Anal. Recognit.
- EURASIP J. Adv. Signal Process.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- J. Intell. Fuzzy Syst.
- WPNC
- IROS
- VTC Fall
- WACV
- IEEE Trans. Instrum. Meas.
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