BINARY FEATURES
Experts
- Lambert Schomaker
- Somaya Al-Máadeed
- Imran Siddiqi
- Vincent Christlein
- Joseph Kee-Yin Ng
- Horst Bunke
- Umapada Pal
- Marius Bulacu
- Lianwen Jin
- Alicia Fornés
- Sheng He
- Andreas K. Maier
- Chawki Djeddi
- Luiz S. Oliveira
- Ahmed Bouridane
- Sargur N. Srihari
- Josep Lladós
- Diego Bertolini
- Marcus Liwicki
- Shinsuke Hara
- Mohamed El Youssfi El Kettani
- Suresh Sundaram
- Volker Märgner
- Yaâcoub Hannad
- Claudio De Stefano
- Abdelaali Hassaïne
- Junyang Zhou
- Alessandra Scotto di Freca
- Jaeyoung Choi
- Qiang Yang
- Anguelos Nicolaou
- Chien-Sheng Chen
- Slim Kanoun
- Xiaoqing Ding
- Mathias Seuret
- Gerald Friedland
- Francesco Fontanella
- Jen-Chun Chang
- Ameur Bensefia
Venues
- CoRR
- ICDAR
- ICFHR
- ICPR
- IEEE Access
- ICASSP
- Sensors
- Pattern Recognit.
- Wirel. Pers. Commun.
- GLOBECOM
- Multim. Tools Appl.
- PIMRC
- Pattern Recognit. Lett.
- Document Analysis Systems
- ICC
- WCNC
- IEEE Trans. Signal Process.
- IEEE Trans. Veh. Technol.
- Expert Syst. Appl.
- CVPR
- IEICE Trans. Commun.
- ICIP
- ICRA
- IEEE Commun. Lett.
- SIU
- IEEE Trans. Mob. Comput.
- Entropy
- IPIN
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- SMC
- EURASIP J. Adv. Signal Process.
- Int. J. Document Anal. Recognit.
- IROS
- J. Intell. Fuzzy Syst.
- WPNC
- AAAI
- IEEE Trans. Pattern Anal. Mach. Intell.
- Eng. Appl. Artif. Intell.
- ICME
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