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Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost.
Yindong Xiao
Yutong Zeng
Qiong Wu
Ke Liu
Yanjun Li
Chong Hu
Published in:
J. Electron. Test. (2022)
Keyphrases
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integrated circuit
parameter set
built in self test
signal processing
genetic algorithm
electron beam
parameter settings
test cases
image restoration
digital images
probabilistic model
image formation
pattern recognition
printed circuit boards
video sequences
image processing
real time