Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic.
Maryam AshoueiAbhijit ChatterjeeAdit D. SinghPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2010)
Keyphrases
- floating gate
- low cost
- delay insensitive
- chip design
- random access memory
- high speed
- power consumption
- nano scale
- physical design
- multi valued
- general purpose
- asynchronous circuits
- classical logic
- modal logic
- logic programming
- parameter tuning
- circuit design
- manufacturing process
- hardware implementation
- digital circuits
- fine tuning
- low power
- digital camera
- predicate logic
- reconfigurable architecture
- real time
- logic programs
- analog vlsi
- power supply
- logical framework