Measuring Nanoscale Distances by Structured Illumination Microscopy and Image Cross-Correlation Spectroscopy (SIM-ICCS).
Isotta CaineroElena CeruttiMario FarettaGaetano DellinoPier Giuseppe PelicciAlberto DiasproLuca LanzanòPublished in: Sensors (2021)
Keyphrases
- cross correlation
- template matching
- variational optical flow
- frequency domain
- image analysis
- single image
- lighting conditions
- multiscale
- input image
- image data
- spherical harmonics
- image matching
- illumination conditions
- x ray
- image features
- high resolution
- imaging conditions
- image segmentation
- mutual information
- edge detection
- pixel intensities
- displacement field
- varying illumination
- illumination insensitive