Sequence-based In-Circuit Breakpoints for Post-Silicon Debug (Abstract Only).

Yutaka Tamiya Yoshinori Tomita Toshiyuki Ichiba Kaoru Kawamura

Published in: FPGA (2015)

Keyphrases

high speed
semiconductor devices
high density
gallium arsenide
real time
high level
analog circuits
data sets
learning algorithm
low cost
higher level
circuit design
sequence analysis
field effect transistors
duty cycle