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Testing High-Speed IO Links Using On-Die Circuitry.

Priya IyerShailendra JainBryan CasperJason Howard
Published in: VLSI Design (2006)
Keyphrases
  • high speed
  • low power
  • test cases
  • real time
  • link analysis
  • focal plane
  • data mining
  • machine learning
  • genetic algorithm
  • search algorithm
  • highly efficient
  • test suite
  • high speed networks