Statistical SRAM Read Access Yield Improvement Using Negative Capacitance Circuits.
Hassan MostafaMohab AnisMohamed I. ElmasryPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
- high speed
- low power
- power consumption
- random access memory
- power dissipation
- positive and negative
- read write
- high frequency
- significant improvement
- power reduction
- information theoretic
- access control
- data transmission
- cmos technology
- statistical models
- data driven
- database
- statistical information
- statistical inference
- logic circuits
- data sets
- unit length
- digital circuits
- design considerations
- information access
- low cost