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Comparative Study on Leakage Current of Power-Gated SRAMs for 65-nm, 45-nm, 32-nm Technology Nodes.
Duk-Hyung Lee
Dong-Kone Kwak
Kyeong-Sik Min
Published in:
J. Comput. (2008)
Keyphrases
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comparative study
nm technology
power consumption
leakage current
power dissipation
low power
power management
energy efficiency
energy saving
data center
low voltage
neural network
cmos technology
digital signal processing
silicon dioxide
electrical properties
pattern matching