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Semiconductor manufacturing process monitoring using built-in self-test for embedded memories.
Ivo Schanstra
Dharmajaya Lukita
Ad J. van de Goor
Kees Veelenturf
Paul J. van Wijnen
Published in:
ITC (1998)
Keyphrases
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semiconductor manufacturing
process control
discrete event simulation
built in self test
embedded systems
production system
data sets
control software
neural network
social networks
computer vision
decision making
database systems
similarity measure
information technology
artificial neural networks