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Challenges for high-density 16Gb ReRAM with 27nm technology.
Scott Sills
Shuichiro Yasuda
Alessandro Calderoni
Christopher Cardon
Jonathan Strand
Katsuhisa Aratani
Nirmal Ramaswamy
Published in:
VLSIC (2015)
Keyphrases
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high density
low density
nm technology
close proximity
lessons learned
high power
data center
thin film
magnetic recording
power consumption
high bandwidth
magnetic tape
low power
databases
high speed
chemical vapor deposition
computer vision