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A modular and scalable system for electromagnetic compatibility testing of integrated circuits.
Daniel Kircher
Simon Profanter
Bernd Deutschmann
Published in:
Elektrotech. Informationstechnik (2024)
Keyphrases
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integrated circuit
test cases
software testing
electron beam
data sets
highly scalable
highly flexible
image processing
low cost
printed circuit boards
test set
high frequency
memory efficient
test data
computer systems
case study
neural network