Hot-carrier reliability of submicron NMOSFETs and integrated NMOS low noise amplifiers.
Sasan NasehM. Jamal DeenChih-Hung ChenPublished in: Microelectron. Reliab. (2006)
Keyphrases
- low signal to noise ratio
- high noise
- random noise
- signal to noise ratio
- noisy data
- noise level
- missing data
- image noise
- neural network
- vlsi circuits
- low power
- electron beam
- noise free
- signal noise ratio
- real time
- sensor noise
- additive noise
- data sets
- highly reliable
- power spectrum
- reliability analysis
- dynamic logic
- gaussian noise
- noise reduction
- noise sensitivity
- genetic algorithm