Ordering of analog specification tests based on parametric defect level estimation.

Nourredine Akkouche Salvador Mir Emmanuel Simeu

Published in: VTS (2010)

Keyphrases

databases
signal processing
parametric models
parameter estimation
high level
database
higher level
estimation process
database systems
relational databases
least squares
image processing
learning algorithm
knowledge level
estimation accuracy
semi parametric
defect detection